Keithley
Keithley 2601B-PULSE — System SourceMeter Pulser | SourceMeter SMU
The System SourceMeter® 10 µsec Pulser/Source Measure Unit (SMU) Instrument combines the power of a high current/high speed pulser with measure and the full functionality of a…
The System SourceMeter® 10 µsec Pulser/Source Measure Unit (SMU) Instrument combines the power of a high current/high speed pulser with measure and the full functionality of a traditional SMU in a single instrument. Its impressive 10 A @ 10 V at 10 μs pulse width and full 1 MS/s digitizing capabilities significantly boost productivity in applications ranging from benchtop characterization through highly automated pulsed I-V production test.
Achieve high pulse fidelity without manual pulse tuning
The 2601B-PULSE’s control loop system eliminates the need to manually tune for load changes up to 3 μH, ensuring your pulse has no overshoot and ringing when outputting pulses from 10 μs up to 500 μs at any current level up to 10 amps. With pulse rise times < 1.7 μs, you can properly characterize your device or circuit under test.
- Output 10 A @ 10 V with a 10 μs pulse width
- Pulse rise time <1.7 μs to characterize with confidence
- High fidelity pulse output without tuning at any current level
Incorporates the functionality of a fast pulser and SMU in one instrument
The 2601B-PULSE adds pulser functionality to the superior measurement integrity, synchronization, speed, and accuracy you know from the industry-leading Keithley 2601B SMU instrument.
- Pulser 0.05% basic measure accuracy with 1 MS/s digitizing
- SMU 100 nA low current range with 100 fA sensitivity
- Rear panel BNC connections for quick cable setup
Embedded scripting and connectivity for unmatched production throughput
Test Script Processor (TSP®) technology embeds and executes complete test programs inside the SMU instrument to deliver industry-best performance. TSP-Link® technology enables expansion of up to 32 TSP-Link nodes for creating high-speed, SMU-per-pin parallel testing without a mainframe.
- Eliminates time-consuming bus communications to and from the PC
- Advanced data processing and flow control
- Connect up to 32 TSP-Link nodes
- Reconfigure easily as test requirements change
Spesifikasi
| Model & Series | 2601B-PULSE 10 µsec Pulser/SMU |
|---|---|
| Channels | 1 |
| Max Current Source/Measure Range | 10 A |
| Max Voltage Source/Measure Range | 40 V |
| Measurement Resolution (Current / Voltage) | 100 fA / 100 nV |
| Power | Pulser: 100 W instantaneousSMU: 200 W instantaneous |
Aplikasi
Laser Diode (VCSEL) Production Test for ToF/LIDAR Applications | Pengujian Produksi Dioda Laser (VCSEL) untuk Aplikasi ToF/LIDAR
The ideal solution for laser diode vertical cavity surface emitting laser (VCSEL) LIV production testing, the 2601B-PULSE features a high speed and high accuracy 10 μs Pulser and SMU for both current pulse sourcing and voltage-current monitoring of VCSELs, VCSEL…
- Programmable pulse current source up to 10 A and 10 µs pulse widths
- Voltage and current measure resolution at 100 nV and 100 fA
- Built-in TSP® processing capability reduces PC-instrument bus communication
Failure Analysis and Quality Assurance | Analisis Kegagalan dan Jaminan Mutu
Semiconductor companies and semiconductor researchers are constantly looking for ways to make devices fail to prevent them in the field. Semiconductor failure analysis (FA) engineers spend countless hours trying to understand why a device failed and how it can be…
- Streamline FA processes with SMU and Pulse testing
- Digital I/O to trigger external IR cameras
- Built-in timer function with 1 μs resolution and ±100 ppm accuracy.
Simplified Pulsed/DC I/V Characterization of LEDs | Karakterisasi I/V Pulsa/DC LED yang Disederhanakan
The 2601B-PULSE's unique current pulsing, DC voltage, and current capabilities enable high speed LED DC and Pulsed IV characterization and production test with 0.015% basic measure accuracy. Pulse testing a microLED, LED, or high brightness LED (HBLED) minimizes self-heating and…
- Programmable current source up to 10 A and 10 µs pulse widths
- Voltage and current measure resolution at 100 nV and 100 fA
- 1 Megasample/second digitizers for fast source and measure data collection
- Built-in TSP processing capability reduces PC-instrument bus communication
On Wafer Semiconductor Testing | Pengujian Semikonduktor On-Wafer
Keithley’s 2601B-PULSE and other Series 2600B System SourceMeter® SMU instruments combine the scalability and flexibility of rack-and-stack instruments with the integration and high throughput of mainframe-based systems, using TSP and TSP-Link technologies to reduce manufacturing footprint and cost of test.…
- Built-in TSP processing capability reduces PC-instrument bus communication
- TSP-Link up to 32 instruments at 500 ns synchronization with other Keithley TSP instruments
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Referensi
https://www.tek.com/en/products/keithley/source-measure-units/2601b-pulse-system-sourcemeter