Keithley
Keithley 4200A-SCS Parameter Analyzer | Analisis Parameter Semikonduktor
Accelerate research, reliability and failure analysis studies of semiconductor devices, materials and process development with the 4200A-SCS.
Available models include 4200A-SCS-PKA High Resolution IV, 4200A-SCS-PKB High Resolution IV & CV, 4200A-SCS-PKC High Power IV & CV, 4200-BTI-A Ultra-fast NBTI/PBTI.

Accelerate research, reliability and failure analysis studies of semiconductor devices, materials and process development with the 4200A-SCS. The highest performance parameter analyzer, it delivers synchronizing current-voltage (I-V), capacitance-voltage (C-V) and ultra-fast pulsed I-V measurements. Try it FREE on your PC .
Parametric insight, fast and clear.
Advancing your bold discoveries has never been easier. The 4200A-SCS Parameter Analyzer reduces the time from setup to running characterization tests by up to 50%, allowing uncompromised measurement and analysis capability. Plus, embedded measurement expertise provides unparalleled test guidance and gives supreme confidence in the resulting measurements.
- Advanced measurement hardware for DC I-V, C-V, and pulsed I-V measurement types
- Begin testing immediately with hundreds of user-modifiable application tests included in the Clarius software
- Automated real-time parameter extraction, data graphing, analysis functions
Accurate C-V Characterization
Measure single-digit femtofarads with Keithley's newest capacitance-voltage unit (CVU), the 4215-CVU. By integrating a 1 V AC source into Keithley's industry-leading CVU architecture, the 4215-CVU offers low-noise capacitance measurements at frequencies from 1 kHz to 10 MHz.
Making Femtofarad (1e-15F) Capacitance Measurements with the 4215-CVU
- First C-V meter in its class capable of driving a 1 V AC source voltage
- 1 kHz frequency resolution from 1 kHz to 10 MHz
- Measure capacitance, conductance, and admittance
- Measure on up to four channels with the 4200A-CVIV Multiswitch
Measure. Switch. Repeat.
The 4200A-CVIV Multi-Switch automatically switches between I-V and C-V measurements without re-cabling or lifting the prober tips. Unlike competing products, the four-channel 4200A-CVIV display provides local visual insight for quick test setup and easy troubleshooting when unexpected results occur.
- Move C-V measurement to any device terminal without re-cabling
- User-configurable for low current capability
- Personalize the names of output channels
- View real-time test status
Stable Low-Current Measurements for I-V Characterization
With the 4201-SMU and 4211-SMU modules you can achieve stable low current measurements in a high capacitance system. With four models of source measure unit (SMU) to choose from, the 4200A-SCS can be customized to meet all of your I-V measurement needs. By offering field Installable Units and optional preamplifier modules, Keithley makes sure that you can make the most accurate low current measurements with little to no downtime.
- Add an SMU without sending the instrument back to the factory
- Make femptoamp measurements
- Up to 9 SMU channels
- Optimized for long cables or large chucks
Integrated Solution with Analytical Probers and Cryogenic Controllers
The 4200A-SCS Parameter Analyzer supports many manual and semi-automated wafer probers and cryogenic temperature controllers, including MPI, Cascade MicroTech, Lucas Labs/Signatone, MicroManipulator, Wentworth Laboratories, LakeShore Model 336 cryogenic temperature controller.
- "Point and click" test sequencing
- "Manual" prober mode tests prober functionality
- Fake prober mode enables debugging without removing commands
Cut Costs and Protect Your Investment
Keithley Care plans provide fast, high-quality services at a fraction of the cost of on-demand service events. You are one click or phone call away from obtaining repair coverage – no quotes, purchase orders, or approval delays.
Learn More
Model & Varian
| Model | Description |
|---|---|
| 4200A-SCS-PKA High Resolution IV | 4200 A-SCS: Parameter Analyzer mainframe 4201-SMU: Two medium power SMUs for high capacitance setups 4200-PA: One preamplifier 8101-PIV: One test fixture with sample devices |
| 4200A-SCS-PKB High Resolution IV & CV | 4200 A-SCS: Parameter Analyzer mainframe 4201-SMU: Two medium power SMUs for high capacitance setups 4200-PA: One preamplifier 4215-CVU: One high resolution multi-frequency C-V unit 8101-PIV: One test fixture with sample devices |
| 4200A-SCS-PKC High Power IV & CV | 4200 A-SCS: Parameter Analyzer mainframe 4201-SMU: Two medium power SMUs for high capacitance setups 4211-SMU: Two high power SMUs for high capacitance setups 4200-PA: Two preamplifier 4215-CVU: One high resolution multi-frequency C-V unit 8101-PIV: One test fixture with sample devices |
| 4200-BTI-A Ultra-fast NBTI/PBTI | For sophisticated NBTI and PBTI measurements on leading-edge silicon CMOS technology Package 4200-BTI-A includes: (1) 4225-PMU Ultra-Fast I-V Module (2) 4225-RPM Remote Preamplifier/Switch Modules Automated Characterization Suite (ACS) Software Ultra-Fast BTI Test Project Module Cabling |
Geser tabel ke samping untuk melihat semua spesifikasi →
Spesifikasi
| Model & Series | Keithley 4200A-SCS Parameter Analyzer |
|---|---|
| Description | Model-dependent — see Model & Varian |
Aplikasi
Biosensor Characterization | Karakterisasi Biosensor
Biosensors or bioFETs convert biological response to an analyte into an electrical signal. The Clarius Software that is integrated into the 4200A-SCS includes a project for testing bioFETs. Use it as a starting point to characterize transfer and output characteristics…
Femtofarad Capacitance Measurements | Pengukuran Kapasitansi Femtofarad
Measure sub-femtofarad capacitances with the 4215-CVU module. By driving 1 V AC, the 4215-CVU can achieve a noise level as low as six attofarads when measuring a 1 fF capacitor. This is just one of dozens of applications included with…
- Built-in femtofarad measurement capability
- 10,000 frequency steps from 1kHz to 10MHz
- Customize any test to any device using user libraries
Semiconductor and NVM Reliability | Keandalan Semikonduktor dan NVM
Put your new technologies to the test with thorough pulsed I-V characterization. The 4200A-SCS comes with support and ready-to-run tests for the latest in NVRAM technologies from floating gate flash to ReRAM and FeRAM. Dual sourcing and measuring capabilities in…
C-V Measurement for High Impedance Applications | Pengukuran C-V untuk Aplikasi Impedansi Tinggi
Use Keithley’s custom Very Low Frequency C-V Technique to analyze the capacitance of your high resistance sample. This technique is performed using only source measure unit (SMU) instruments but can be combined with a 4210-CVU to perform higher frequency measurements…
- .01 to 10 Hz frequency range with sensitivity of 1 pF to 10 nF
- 3½-digit typical resolution, minimum typical of 10 fF
Testing when using Long Cables or Capacitive Fixtures | Pengujian dengan Kabel Panjang atau Fixture Kapasitif
Use 4201 or 4211-SMUs when making tests requires very long cabling or fixtures with higher capacitances. These SMUs are ideal for connecting to LCD test stations, probers, switch matrices or any other large or complicated tester. Field installable versions allow…
Resistivity of Materials | Resistivitas Material
Use a 4200A-SCS with integrated SMUs to easily measure resistivity using a four-point collinear probe or van der Pauw method. Included tests perform repetitive van der Pauw calculations automatically, saving you valuable research time. A maximum current resolution of 10aA…
MOSFET Characterization | Karakterisasi MOSFET
The 4200A-SCS can hold all the instruments necessary for full characterization of MOS devices through component or on-wafer testing. Included tests and projects solve for oxide thickness of a MOSCap, threshold voltages, doping concentration, mobile ion concentration, and more. All…
Butuh konsultasi teknis?
Kirim kebutuhan pengujian Anda — tim Terastek membantu menentukan konfigurasi yang sesuai.
Produk Terkait
Referensi
https://www.tek.com/en/products/keithley/4200a-scs-parameter-analyzer




