Keithley SMU & SourceMeter
Keithley 4200A-SCS — Parameter Analyzer
Keithley 4200A-SCS Parameter Analyzer · SMU & SourceMeter
Spesifikasi Utama
- DC Current-Voltage (I-V) Range10 aA - 1A 0.2 µV - 210 V
- Capacitance-Voltage (C-V) Range1 kHz - 10 MHz ± 30V DC bias
- Pulsed I-V Range±40 V (80 V p-p), ±800 mA 200 MSa/sec, 5 ns sampling rate
Gambaran Umum
Parameter Analyzer 4200A-SCS untuk karakterisasi semikonduktor, material, dan analisis kegagalan (failure analysis) dengan kumpulan pengukuran lengkap dan GUI berbasis proyek.
Spesifikasi
| DC Current-Voltage (I-V) Range | 10 aA - 1A 0.2 µV - 210 V |
| Capacitance-Voltage (C-V) Range | 1 kHz - 10 MHz ± 30V DC bias |
| Pulsed I-V Range | ±40 V (80 V p-p), ±800 mA 200 MSa/sec, 5 ns sampling rate |
Aplikasi
Keithley Keithley 4200A-SCS Parameter Analyzer — aplikasi utama dari pabrikan:
Accurate C-V Characterization
Measure single-digit femtofarads with Keithley's newest capacitance-voltage unit (CVU), the 4215-CVU. By integrating a 1 V AC source into Keithley's industry-leading CVU architecture, the 4215-CVU offers low-noise capacitance measurements at frequencies from 1 kHz to 10 MHz.
- First C-V meter in its class capable of driving a 1 V AC source voltage
- 1 kHz frequency resolution from 1 kHz to 10 MHz
- Measure capacitance, conductance, and admittance
- Measure on up to four channels with the 4200A-CVIV Multiswitch
Biosensor Characterization
Biosensors or bioFETs convert biological response to an analyte into an electrical signal. The Clarius Software that is integrated into the 4200A-SCS includes a project for testing bioFETs. Use it as a starting point to characterize transfer and output characteristics…
Femtofarad Capacitance Measurements
Measure sub-femtofarad capacitances with the 4215-CVU module. By driving 1 V AC, the 4215-CVU can achieve a noise level as low as six attofarads when measuring a 1 fF capacitor. This is just one of dozens of applications included with…
- Built-in femtofarad measurement capability
- 10,000 frequency steps from 1kHz to 10MHz
- Customize any test to any device using user libraries
Semiconductor and NVM Reliability
Put your new technologies to the test with thorough pulsed I-V characterization. The 4200A-SCS comes with support and ready-to-run tests for the latest in NVRAM technologies from floating gate flash to ReRAM and FeRAM. Dual sourcing and measuring capabilities in…
Resistivity of Materials
Use a 4200A-SCS with integrated SMUs to easily measure resistivity using a four-point collinear probe or van der Pauw method. Included tests perform repetitive van der Pauw calculations automatically, saving you valuable research time. A maximum current resolution of 10aA…
MOSFET Characterization
The 4200A-SCS can hold all the instruments necessary for full characterization of MOS devices through component or on-wafer testing. Included tests and projects solve for oxide thickness of a MOSCap, threshold voltages, doping concentration, mobile ion concentration, and more. All…
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