Keithley SMU & SourceMeter
Keithley 2601B-PULSE — System SourceMeter Pulser
Keithley 2601B-PULSE System SourceMeter · SMU & SourceMeter
Spesifikasi Utama
- Channels1 Pulser / 1 SMU
- Pulser V/I Range1 μA - 10 A 1 μV - 10 V
- SMU V/I Range100 fA - 10 A 100 nV - 40 V
- AccuracyPulser: 0.05% SMU: 0.015%
- Max Speed1 M readings/s
Gambaran Umum
System SourceMeter Pulser 10 µs untuk pengujian pulse cepat pada komponen semikonduktor dan aplikasi karakterisasi dinamik.
Spesifikasi
| Channels | 1 Pulser / 1 SMU |
| Pulser V/I Range | 1 μA - 10 A 1 μV - 10 V |
| SMU V/I Range | 100 fA - 10 A 100 nV - 40 V |
| Accuracy | Pulser: 0.05% SMU: 0.015% |
| Max Speed | 1 M readings/s |
Aplikasi
Keithley Keithley 2601B-PULSE System SourceMeter — aplikasi utama dari pabrikan:
Failure Analysis and Quality Assurance
Semiconductor companies and semiconductor researchers are constantly looking for ways to make devices fail to prevent them in the field. Semiconductor failure analysis (FA) engineers spend countless hours trying to understand why a device failed and how it can be…
- Streamline FA processes with SMU and Pulse testing
- Digital I/O to trigger external IR cameras
- Built-in timer function with 1 μs resolution and ±100 ppm accuracy.
Simplified Pulsed/DC I/V Characterization of LEDs
The 2601B-PULSE's unique current pulsing, DC voltage, and current capabilities enable high speed LED DC and Pulsed IV characterization and production test with 0.015% basic measure accuracy. Pulse testing a microLED, LED, or high brightness LED (HBLED) minimizes self-heating and…
- Programmable current source up to 10 A and 10 µs pulse widths
- Voltage and current measure resolution at 100 nV and 100 fA
- 1 Megasample/second digitizers for fast source and measure data collection
- Built-in TSP processing capability reduces PC-instrument bus communication
On Wafer Semiconductor Testing
Keithley’s 2601B-PULSE and other Series 2600B System SourceMeter® SMU instruments combine the scalability and flexibility of rack-and-stack instruments with the integration and high throughput of mainframe-based systems, using TSP and TSP-Link technologies to reduce manufacturing footprint and cost of test.…
- Built-in TSP processing capability reduces PC-instrument bus communication
- TSP-Link up to 32 instruments at 500 ns synchronization with other Keithley TSP instruments
Laser Diode (VCSEL) Production Test for ToF/LIDAR Applications
The ideal solution for laser diode vertical cavity surface emitting laser (VCSEL) LIV production testing, the 2601B-PULSE features a high speed and high accuracy 10 μs Pulser and SMU for both current pulse sourcing and voltage-current monitoring of VCSELs, VCSEL…
- Programmable pulse current source up to 10 A and 10 µs pulse widths
- Voltage and current measure resolution at 100 nV and 100 fA
- Built-in TSP® processing capability reduces PC-instrument bus communication
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