KatalogSMU & SourceMeterKeithley 2606B — SourceMeter SMU 4-Kanal
Keithley 2606B — SourceMeter SMU 4-Kanal
Keithley SMU & SourceMeter

Keithley 2606B — SourceMeter SMU 4-Kanal

Keithley 2606B System SourceMeter SMU · SMU & SourceMeter
Spesifikasi Utama
  • CHANNELS4
  • V/I RANGE100fA - 3A 100nV - 20V
  • ACCURACY0.015% 6.5 digits
  • MAX SPEED20k readings/s to buffer

Gambaran Umum

SourceMeter SMU 4-kanal untuk aplikasi pengukuran paralel multi-device pada pengujian produksi baterai, LED, dan komponen.

Spesifikasi

CHANNELS4
V/I RANGE100fA - 3A 100nV - 20V
ACCURACY0.015% 6.5 digits
MAX SPEED20k readings/s to buffer

Aplikasi

Keithley Keithley 2606B System SourceMeter SMU — aplikasi utama dari pabrikan:

High Volume Production Test of LEDs The 2606B SMU is an industry leading instrument for LED DC characterization and production test. It's configurable to source current or voltage coupled with voltage and current measurement at 0.015% basic measure accuracy for a variety of test needs. In…
  • Programmable current source up to 3 A and 100 µs pulse widths
  • Voltage and current measure resolution at 100 nV and 0.1 fA
  • Built-in TSP processing capability reduces PC-instrument bus communication
  • Daisy-chain up to 64 channels for high volume parallel test
Laser Diode (VCSEL) Production Test for 3D Sensing Applications Industry's best DC test system for Laser Diode (LD) production test uses high speed and high accuracy SMUs for both current sourcing and voltage-current monitoring of laser diode modules, photodiode current. SMUs are the most cost-effective LIV instrumentation with high…
  • Programmable current source up to 3 A and 100 µs pulse widths
  • Voltage and current measure resolution at 100 nV and 0.1 fA
  • Built-in TSP processing capability reduces PC-instrument bus communication
Transistor Characterization with Multi-Channel SMU Instruments With its integrated source and measure, voltage or current, precision and accuracy, a 2606B System SourceMeter SMU instrument is ideal for testing transistors on wafer or in packaged parts including capturing drain family of curves, threshold voltage, gate leakage and…
  • Programmable current source up to 3 A and 100 µs pulse widths
  • Voltage and current measure resolution at 100 nV and 0.1 fA
  • Best accuracy 0.015% with 6½-digit resolution
  • Built-in TSP processing capability reduces PC-instrument bus communication

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